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Conference contributions
Integration and dielectric reliability of 30nm 1/2 pitch structures in Aurora LK HM
Publication:
Integration and dielectric reliability of 30nm 1/2 pitch structures in Aurora LK HM
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Date
2009
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Demuynck, Steven
;
Huffman, Craig
;
Claes, Martine
;
Suhard, Samuel
;
Versluijs, Janko
;
Volders, Henny
;
Heylen, Nancy
;
Kellens, Kristof
;
Croes, Kristof
;
Struyf, Herbert
;
Vereecke, Guy
;
Verdonck, Patrick
;
De Roest, David
;
Beynet, Julien
;
Sprey, Hessel
;
Beyer, Gerald
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1885
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Acq. date: 2025-12-10
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Metrics
Views
1885
since deposited on 2021-10-17
2
last month
1
last week
Acq. date: 2025-12-10
Citations