dc.contributor.author | Demuynck, Steven | |
dc.contributor.author | Huffman, Craig | |
dc.contributor.author | Claes, Martine | |
dc.contributor.author | Suhard, Samuel | |
dc.contributor.author | Versluijs, Janko | |
dc.contributor.author | Volders, Henny | |
dc.contributor.author | Heylen, Nancy | |
dc.contributor.author | Kellens, Kristof | |
dc.contributor.author | Croes, Kristof | |
dc.contributor.author | Struyf, Herbert | |
dc.contributor.author | Vereecke, Guy | |
dc.contributor.author | Verdonck, Patrick | |
dc.contributor.author | De Roest, David | |
dc.contributor.author | Beynet, Julien | |
dc.contributor.author | Sprey, Hessel | |
dc.contributor.author | Beyer, Gerald | |
dc.date.accessioned | 2021-10-17T21:55:40Z | |
dc.date.available | 2021-10-17T21:55:40Z | |
dc.date.issued | 2009 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/15221 | |
dc.source | IIOimport | |
dc.title | Integration and dielectric reliability of 30nm 1/2 pitch structures in Aurora LK HM | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Demuynck, Steven | |
dc.contributor.imecauthor | Claes, Martine | |
dc.contributor.imecauthor | Suhard, Samuel | |
dc.contributor.imecauthor | Versluijs, Janko | |
dc.contributor.imecauthor | Volders, Henny | |
dc.contributor.imecauthor | Heylen, Nancy | |
dc.contributor.imecauthor | Kellens, Kristof | |
dc.contributor.imecauthor | Croes, Kristof | |
dc.contributor.imecauthor | Struyf, Herbert | |
dc.contributor.imecauthor | Vereecke, Guy | |
dc.contributor.imecauthor | Verdonck, Patrick | |
dc.contributor.imecauthor | De Roest, David | |
dc.contributor.imecauthor | Sprey, Hessel | |
dc.contributor.imecauthor | Beyer, Gerald | |
dc.contributor.orcidimec | Croes, Kristof::0000-0002-3955-0638 | |
dc.contributor.orcidimec | Vereecke, Guy::0000-0001-9058-9338 | |
dc.contributor.orcidimec | Verdonck, Patrick::0000-0003-2454-0602 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 1094 | |
dc.source.endpage | 1095 | |
dc.source.conference | International Conference on Solid State Devices and Materials - SSDM | |
dc.source.conferencedate | 7/10/2009 | |
dc.source.conferencelocation | Sendai Japan | |
imec.availability | Published - imec | |