dc.contributor.author | Dictus, Dries | |
dc.contributor.author | Shamiryan, Denis | |
dc.contributor.author | Paraschiv, Vasile | |
dc.contributor.author | Baklanov, Mikhaïl | |
dc.contributor.author | Boullart, Werner | |
dc.contributor.author | De Gendt, Stefan | |
dc.contributor.author | Vinckier, Chris | |
dc.date.accessioned | 2021-10-17T21:59:06Z | |
dc.date.available | 2021-10-17T21:59:06Z | |
dc.date.issued | 2009 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/15238 | |
dc.source | IIOimport | |
dc.title | Plasma etch chamber wall deposits – impact on etch species density and evaluation of cleaning procedures | |
dc.type | Meeting abstract | |
dc.contributor.imecauthor | Dictus, Dries | |
dc.contributor.imecauthor | Paraschiv, Vasile | |
dc.contributor.imecauthor | Boullart, Werner | |
dc.contributor.imecauthor | De Gendt, Stefan | |
dc.contributor.orcidimec | Dictus, Dries::0000-0002-7896-1747 | |
dc.contributor.orcidimec | Boullart, Werner::0000-0001-7614-2097 | |
dc.contributor.orcidimec | De Gendt, Stefan::0000-0003-3775-3578 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | yes | |
dc.source.beginpage | PS2-ThA11 | |
dc.source.conference | AVS 56th International Symposium & Exhibition | |
dc.source.conferencedate | 8/11/2009 | |
dc.source.conferencelocation | San Jose, CA USA | |
imec.availability | Published - imec | |