Authors

Dixit, Abhisek; Bandhyopadhyay, Anirban; Collaert, Nadine; De Meyer, Kristin; Jurczak, Gosia

Conference

22nd International Conference on VLSI Design

Title

Measurement and analysis of parasitic capacitance in FinFETs with high-k dielectrics and metal-gate stack

Publication type

Proceedings paper