dc.contributor.author | Doria, R.T. | |
dc.contributor.author | Cerdeira, A. | |
dc.contributor.author | Martino, J.A. | |
dc.contributor.author | Simoen, Eddy | |
dc.contributor.author | Claeys, Cor | |
dc.contributor.author | Pavanello, M.A. | |
dc.date.accessioned | 2021-10-17T22:00:16Z | |
dc.date.available | 2021-10-17T22:00:16Z | |
dc.date.issued | 2009 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/15244 | |
dc.source | IIOimport | |
dc.title | Fin width influence on the harmonic distortion of standard and strained FinFETs operating in saturation | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Simoen, Eddy | |
dc.contributor.orcidimec | Simoen, Eddy::0000-0002-5218-4046 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | no | |
dc.source.beginpage | 613 | |
dc.source.endpage | 620 | |
dc.source.conference | 24th Symposium on Microelectronics Technology and Devices - SBMicro | |
dc.source.conferencedate | 31/08/2009 | |
dc.source.conferencelocation | Natal Brazil | |
imec.availability | Published - open access | |
imec.internalnotes | ECS Transactions; Vol. 23, issue 1 | |