dc.contributor.author | Teerlinck, Ivo | |
dc.contributor.author | Mertens, Paul | |
dc.contributor.author | Vos, Rita | |
dc.contributor.author | Meuris, Marc | |
dc.contributor.author | Heyns, Marc | |
dc.date.accessioned | 2021-09-29T15:31:25Z | |
dc.date.available | 2021-09-29T15:31:25Z | |
dc.date.issued | 1996 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/1527 | |
dc.source | IIOimport | |
dc.title | Effect of anions on copper outplating from HF solutions | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Mertens, Paul | |
dc.contributor.imecauthor | Vos, Rita | |
dc.contributor.imecauthor | Meuris, Marc | |
dc.contributor.imecauthor | Heyns, Marc | |
dc.contributor.orcidimec | Meuris, Marc::0000-0002-9580-6810 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | no | |
dc.source.beginpage | 21 | |
dc.source.endpage | 24 | |
dc.source.conference | Proceedings of the 3rd International Symposium on Ultra Clean Processing of Silicon Surfaces - UCPSS | |
dc.source.conferencedate | 23/09/1996 | |
dc.source.conferencelocation | Antwerpen Belgium | |
imec.availability | Published - open access | |