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Two-dimensional carrier profiling with sub-nm resolution using SSRM: from basic concept to TCAD calibration and device tuning
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1965 since deposited on 2021-10-17
3last month
Acq. date: 2026-01-11
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Metrics
Views
1965 since deposited on 2021-10-17
3last month
Acq. date: 2026-01-11
Citations