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Switching oxide traps as the missing link between negative bias temperature instability and random telegraph noise

dc.contributor.authorGrasser, Tibor
dc.contributor.authorReisinger, Hans
dc.contributor.authorGoes, Wolfgang
dc.contributor.authorAichinger, Thomas
dc.contributor.authorHehenberger, Phillip
dc.contributor.authorWagner, Paul-Jurgen
dc.contributor.authorNelheibel, M.
dc.contributor.authorFranco, Jacopo
dc.contributor.authorKaczer, Ben
dc.date.accessioned2021-10-17T22:33:20Z
dc.date.available2021-10-17T22:33:20Z
dc.date.issued2009
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/15395
dc.sourceIIOimport
dc.titleSwitching oxide traps as the missing link between negative bias temperature instability and random telegraph noise
dc.typeProceedings paper
dc.contributor.imecauthorFranco, Jacopo
dc.contributor.imecauthorKaczer, Ben
dc.contributor.orcidimecFranco, Jacopo::0000-0002-7382-8605
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage729
dc.source.endpage732
dc.source.conferenceIEEE International Electron Devices Meeting - IEDM
dc.source.conferencedate7/12/2009
dc.source.conferencelocationBaltimore, MD USA
imec.availabilityPublished - open access


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