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Next generation bulk FinFET devices and their benefits for ESD robustness
Publication:
Next generation bulk FinFET devices and their benefits for ESD robustness
Date
2009
Proceedings Paper
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17855.pdf
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Griffoni, Alessio
;
Thijs, Steven
;
Russ, Christian
;
Trémouilles, David
;
Linten, Dimitri
;
Scholz, Mirko
;
Collaert, Nadine
;
Witters, Liesbeth
;
Meneghesso, Gaudentio
;
Groeseneken, Guido
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1968
since deposited on 2021-10-17
Acq. date: 2025-10-23
Citations
Metrics
Views
1968
since deposited on 2021-10-17
Acq. date: 2025-10-23
Citations