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In-situ studies of point defect reactions in silicon by high flux electron iIrradiation in a high voltage transmission electron microscope
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In-situ studies of point defect reactions in silicon by high flux electron iIrradiation in a high voltage transmission electron microscope
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Date
1994
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Fedina, L.
;
Van Landuyt, J.
;
Vanhellemont, Jan
;
Romano, Albert
;
Aseev, A.
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2135
since deposited on 2021-09-29
Acq. date: 2026-01-09
Citations
Metrics
Views
2135
since deposited on 2021-09-29
Acq. date: 2026-01-09
Citations