Authors

Griffoni, Alessio; Thijs, Steven; Russ, Christian; Tremouilles, David; Linten, Dimitri; Scholz, Mirko; Collaert, Nadine; Witters, Liesbeth; Meneghesso, Gaudenzio; Groeseneken, Guido

Conference

RCJ Symposium

Title

Next generation FinFET devices in bulk silicon technology and their benefits for ESD robustness

Publication type

Proceedings paper