EUV resist requirements: absorbance and acid yield
dc.contributor.author | Gronheid, Roel | |
dc.contributor.author | Fonseca, Carlos | |
dc.contributor.author | Leeson, Michael | |
dc.contributor.author | Adams, Jacob | |
dc.contributor.author | Strahan, Jeff | |
dc.contributor.author | Willson, C. Grant | |
dc.contributor.author | Smith, Bruce W. | |
dc.date.accessioned | 2021-10-17T22:34:52Z | |
dc.date.available | 2021-10-17T22:34:52Z | |
dc.date.issued | 2009 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/15401 | |
dc.source | IIOimport | |
dc.title | EUV resist requirements: absorbance and acid yield | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Gronheid, Roel | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | no | |
dc.source.beginpage | 727332 | |
dc.source.conference | Advances in Resist Materials and Processing Technology XXVI | |
dc.source.conferencedate | 22/02/2009 | |
dc.source.conferencelocation | San Jose, CA USA | |
imec.availability | Published - open access | |
imec.internalnotes | Proceedings SPIE; Vol.7273 |