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Conference contributions
EUV resist requirements: absorbance and acid yield
Publication:
EUV resist requirements: absorbance and acid yield
Date
2009
Proceedings Paper
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16950.pdf
260.37 KB
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Gronheid, Roel
;
Fonseca, Carlos
;
Leeson, Michael
;
Adams, Jacob
;
Strahan, Jeff
;
Willson, C. Grant
;
Smith, Bruce W.
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1892
since deposited on 2021-10-17
Acq. date: 2025-10-24
Citations
Metrics
Views
1892
since deposited on 2021-10-17
Acq. date: 2025-10-24
Citations