Show simple item record

In-situ studies of point defect reactions in silicon by high flux electron iIrradiation in a high voltage transmission electron microscope

dc.contributor.authorFedina, L.
dc.contributor.authorVan Landuyt, J.
dc.contributor.authorVanhellemont, Jan
dc.contributor.authorRomano, Albert
dc.contributor.authorAseev, A.
dc.date.accessioned2021-09-29T12:41:15Z
dc.date.available2021-09-29T12:41:15Z
dc.date.issued1994
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/154
dc.sourceIIOimport
dc.titleIn-situ studies of point defect reactions in silicon by high flux electron iIrradiation in a high voltage transmission electron microscope
dc.typeProceedings paper
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage83
dc.source.endpage85
dc.source.conferenceJoint Meeting of the Belgian and Dutch Societies for Electron Microscopy
dc.source.conferencedate1/12/1994
dc.source.conferencelocationArnhem The Netherlands
imec.availabilityPublished - open access


Files in this item

Thumbnail
Name:
146.pdf
Size:
181.7Kb
Format:
PDF
View/open

This item appears in the following collection(s)

Show simple item record