An analysis of the NBTI-induced threshold voltage shift evaluated by different techniques

View/open

18694.pdf (326.5Kb)

Metadata

Show full item record

Authors

Ji, Zhigang; Zhang, Jian Fu; Chang, Mo Huai; Kaczer, Ben; Groeseneken, Guido

ISSN

0018-9383

Issue

5

Journal

IEEE Transactions on Electron Devices

Volume

56

Title

An analysis of the NBTI-induced threshold voltage shift evaluated by different techniques

Publication type

Journal article

Embargo date

9999-12-31

Collections

Articles