An analysis of the NBTI-induced threshold voltage shift evaluated by different techniques

Publication:

2009

Journal article

Author(s)

Ji, Zhigang

;

Zhang, Jian Fu

;

Chang, Mo Huai

;

;

IEEE Transactions on Electron Devices

1854 since deposited on 2021-10-17

1last month

Acq. date: 2026-08-03