Authors

Kolbe, M.; Beckhoff, B.; Krumrey, M.; Reading, M.A.; van den Berg, J.A.; Conard, Thierry; De Gendt, Stefan

Conference

216th ECS Meeting

Title

Nanolayer characterisation by reference-free X-ray fluorescence analysis with synchrotron radiation

Publication type

Meeting abstract

Embargo date

9999-12-31