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Epitaxial Ge on standard STI patterned Si wafers: high quality virtual substrates for Ge pMOS and III/V nMOS
Publication:
Epitaxial Ge on standard STI patterned Si wafers: high quality virtual substrates for Ge pMOS and III/V nMOS
Date
2009
Meeting abstract
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18814.pdf
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Loo, Roger
;
Wang, Gang
;
Souriau, Laurent
;
Lin, Vic
;
Brammertz, Guy
;
Caymax, Matty
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Abstract
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1947
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item.page.metrics.field.last-week
Acq. date: 2025-10-24
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Metrics
Views
1947
since deposited on 2021-10-18
437
item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations