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Epitaxial Ge on standard STI patterned Si wafers: high quality virtual substrates for Ge pMOS and III/V nMOS
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Authors
Loo, Roger
;
Wang, Gang
;
Souriau, Laurent
;
Lin, Vic
;
Brammertz, Guy
;
Caymax, Matty
Conference
216th ECS Meeting
Title
Epitaxial Ge on standard STI patterned Si wafers: high quality virtual substrates for Ge pMOS and III/V nMOS
Publication type
Meeting abstract
Embargo date
9999-12-31
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