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Influence of thermal anneal steps on the current collapse of Fluorine treated enhancement mode SiN/AlGaN/GaN HEMTs
Publication:
Influence of thermal anneal steps on the current collapse of Fluorine treated enhancement mode SiN/AlGaN/GaN HEMTs
Date
2009
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Lorenz, Anne
;
Derluyn, Joff
;
Das, Jo
;
Cheng, Kai
;
Degroote, Stefan
;
Medjdoub, Farid
;
Germain, Marianne
;
Borghs, Gustaaf
Journal
Physica Status Solidi C
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1906
since deposited on 2021-10-18
Acq. date: 2025-10-23
Citations
Metrics
Views
1906
since deposited on 2021-10-18
Acq. date: 2025-10-23
Citations