1/f Noise in drain and gate current of MOSFETs with high-k gate stacks

View/open

18605.pdf (511.2Kb)

Metadata

Show full item record

Authors

Magnone, P.; Crupi, F.; Giusi, G.; Pace, C.; Simoen, Eddy; Claeys, Cor; Pantisano, Luigi; Maji, D.; Rao, V.R.; Srinivasan, P.

ISSN

1530-4388

Issue

2

Journal

IEEE Transactions on Device and Materials Reliability

Volume

9

Title

1/f Noise in drain and gate current of MOSFETs with high-k gate stacks

Publication type

Journal article

Embargo date

9999-12-31

Collections

Articles