Publication:

1/f Noise in drain and gate current of MOSFETs with high-k gate stacks

Date

2009

Journal article

Simple item page Full metadata Statistics

Files

18605.pdf 511.23 KB

Author(s)

;

;

;

;

;

;

Pantisano, Luigi

;

;

;

Journal

IEEE Transactions on Device and Materials Reliability

Metrics

2105 since deposited on 2021-10-18

3last month

Acq. date: 2026-01-07