Characterization of interface and oxide traps in Ge pMOSFETs based on DCIV technique

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Authors
Maji, D.; Crupi, F.; Magnone, P.; Giusi, G.; Pace, C.; Simoen, Eddy; Rao, V.Ramgopal
Conference
2nd International Workshop on Electron Devices and Semiconductor Technology - IEDST
Title
Characterization of interface and oxide traps in Ge pMOSFETs based on DCIV technique
Publication type
Proceedings paper
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