Publication:
Characterization of interface and oxide traps in Ge pMOSFETs based on DCIV technique
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1949 since deposited on 2021-10-18
3last month
Acq. date: 2026-04-07
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Statistics
Views
1949 since deposited on 2021-10-18
3last month
Acq. date: 2026-04-07
Citations