Publication:
Characterization of interface and oxide traps in Ge pMOSFETs based on DCIV technique
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1940 since deposited on 2021-10-18
2last month
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Acq. date: 2025-12-10
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Views
1940 since deposited on 2021-10-18
2last month
1last week
Acq. date: 2025-12-10
Citations