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On the cost-effectiveness of KGD testing for TSV-based 3D-SICs
Publication:
On the cost-effectiveness of KGD testing for TSV-based 3D-SICs
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Date
2009
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Marinissen, Erik Jan
;
Beyne, Eric
;
Dupas, Luc
;
Velenis, Dimitrios
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1982
since deposited on 2021-10-18
Acq. date: 2026-10-04
Citations
Statistics
Views
1982
since deposited on 2021-10-18
Acq. date: 2026-10-04
Citations