Authors

Mechri, C; Ruello, P; Breteau, J.M.; Baklanov, Mikhaïl; Verdonck, Patrick; Gusev, V

ISSN

0003-6951

Issue

9

Journal

Applied Physics Letters

Volume

95

Title

Depth profiling of elastic inhomogeneities in transoarent nanomaterials by picosecond ultrasonic interferometry

Publication type

Journal article

Embargo date

9999-12-31