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Investigation of passivation effects in InP HEMT layers

dc.contributor.authorVan Hove, Marleen
dc.contributor.authorFinders, Jo
dc.contributor.authorvan der Zanden, Koen
dc.contributor.authorGeurts, J.
dc.contributor.authorVan Rossum, Marc
dc.date.accessioned2021-09-29T15:40:23Z
dc.date.available2021-09-29T15:40:23Z
dc.date.issued1996
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/1584
dc.sourceIIOimport
dc.titleInvestigation of passivation effects in InP HEMT layers
dc.typeProceedings paper
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage271
dc.source.endpage276
dc.source.conferenceSymposium on Diagnostic Techniques for Semiconductor Materials Processing II
dc.source.conferencedate27/11/1995
dc.source.conferencelocationBoston, MA USA
imec.availabilityPublished - open access
imec.internalnotesMRS Symposium Proceedings; Vol. 406


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