Authors

Mercha, Abdelkarim; Okawa, H.; Akheyar, Amal; Simoen, Eddy; Nakabayashi, T.; Hoffmann, Thomas Y.

Conference

20th International Conference on Noise and Fluctuations - ICNF

Title

Impact of advanced gate stack engineering on low frequency noise performances of planar bulk CMOS transistors

Publication type

Proceedings paper

Embargo date

9999-12-31