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Atomic layer deposition: nucleation and growth behavior of HfO2 dielectrics on semiconductor surfaces
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Atomic layer deposition: nucleation and growth behavior of HfO2 dielectrics on semiconductor surfaces
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Date
2009-06
Dissertation
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18523.pdf
1.89 MB
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Nyns, Laura
Journal
Abstract
Description
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1965
since deposited on 2021-10-18
Acq. date: 2026-02-27
Citations
Statistics
Views
1965
since deposited on 2021-10-18
Acq. date: 2026-02-27
Citations