Publication:
Temperature and frequency dependent electrical characterization of HfO2/InxGa1xAs interfaces using capacitance-voltage and conductance methods
Date
Loading...
Journal
Abstract
Description
Metrics
Views
1962 since deposited on 2021-10-18
1last month
1last week
Acq. date: 2026-01-11
Citations
Metrics
Views
1962 since deposited on 2021-10-18
1last month
1last week
Acq. date: 2026-01-11
Citations