dc.contributor.author | Opsomer, Karl | |
dc.contributor.author | Schaekers, Marc | |
dc.contributor.author | Rampelberg, G. | |
dc.contributor.author | Deduytsche, D. | |
dc.contributor.author | Detavernier, C. | |
dc.contributor.author | Kittl, Jorge | |
dc.date.accessioned | 2021-10-18T01:18:03Z | |
dc.date.available | 2021-10-18T01:18:03Z | |
dc.date.issued | 2009 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/15948 | |
dc.source | IIOimport | |
dc.title | Atomic layer deposition of ZrO2, TiO2, and ZrTiO4 thin films | |
dc.type | Meeting abstract | |
dc.contributor.imecauthor | Opsomer, Karl | |
dc.contributor.imecauthor | Schaekers, Marc | |
dc.contributor.orcidimec | Schaekers, Marc::0000-0002-1496-7816 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | no | |
dc.source.beginpage | 2138 | |
dc.source.conference | 216th ECS Meeting | |
dc.source.conferencedate | 4/10/2009 | |
dc.source.conferencelocation | Vienna Austria | |
imec.availability | Published - open access | |
imec.internalnotes | Meeting ABstracts; Vol. MA2009-02 | |