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O2 post deposition anneal of Al2O3 blocking dielectric for higher performance and reliability of TANOS flash memory
Publication:
O2 post deposition anneal of Al2O3 blocking dielectric for higher performance and reliability of TANOS flash memory
Date
2009
Proceedings Paper
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Rothschild, Aude
;
Breuil, Laurent
;
Van den Bosch, Geert
;
Richard, Olivier
;
Conard, Thierry
;
Franquet, Alexis
;
Cacciato, Antonio
;
Debusschere, Ingrid
;
Jurczak, Gosia
;
Van Houdt, Jan
;
Kittl, Jorge
;
Ganguly, Udayan
;
Date, Lucien
;
Boelen, Pieter
;
Schreutelkamp, Rob
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2085
since deposited on 2021-10-18
Acq. date: 2025-10-23
Citations
Metrics
Views
2085
since deposited on 2021-10-18
Acq. date: 2025-10-23
Citations