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O2 post deposition anneal of Al2O3 blocking dielectric for higher performance and reliability of TANOS flash memory
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Authors
Rothschild, Aude
;
Breuil, Laurent
;
Van den Bosch, Geert
;
Richard, Olivier
;
Conard, Thierry
;
Franquet, Alexis
;
Cacciato, Antonio
;
Debusschere, Ingrid
;
Jurczak, Gosia
;
Van Houdt, Jan
;
Kittl, Jorge
;
Ganguly, Udayan
;
Date, Lucien
;
Boelen, Pieter
;
Schreutelkamp, Rob
Conference
39th European Solid-State Device Research Conference - ESSDERC
Title
O2 post deposition anneal of Al2O3 blocking dielectric for higher performance and reliability of TANOS flash memory
Publication type
Proceedings paper
Embargo date
9999-12-31
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