Authors

Vanhellemont, Jan; Kissinger, G.; Senkader, S.; Gräf, D.; Kenis, Karine; Depas, Michel; Lambert, U.; Wagner, Patrick

Conference

Proceedings of the 4th International Symposium on High Purity Silicon

Title

On the nature of grown-in defects in silicon: dependence on pulling conditions and evolution during treatments

Publication type

Proceedings paper

Embargo date

9999-12-31