Authors

Scarrozza, Marco; Pourtois, Geoffrey; Houssa, Michel; Caymax, Matty; Stesmans, Andre; Meuris, Marc; Heyns, Marc

ISSN

0167-9317

Issue

7_9

Journal

Microelectronic Engineering

Volume

86

Title

A first-principles study of the structural and electronic properties of III-V/thermal oxide interfaces

Publication type

Journal article

Embargo date

9999-12-31