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On-wafer human metal model measurements for system-level ESD analysis on component level

dc.contributor.authorScholz, Mirko
dc.contributor.authorLinten, Dimitri
dc.contributor.authorThijs, Steven
dc.contributor.authorGriffoni, Alessio
dc.contributor.authorSawada, Masanori
dc.contributor.authorNakaei, T
dc.contributor.authorHasebe, Takumi
dc.contributor.authorLafonteese, David
dc.contributor.authorVashchenko, Vladislav
dc.contributor.authorVandersteen, Gerd
dc.contributor.authorHopper, Peter
dc.contributor.authorMeneghesso, Gaudenzio
dc.contributor.authorGroeseneken, Guido
dc.date.accessioned2021-10-18T02:43:22Z
dc.date.available2021-10-18T02:43:22Z
dc.date.issued2009-10
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/16175
dc.sourceIIOimport
dc.titleOn-wafer human metal model measurements for system-level ESD analysis on component level
dc.typeProceedings paper
dc.contributor.imecauthorLinten, Dimitri
dc.contributor.imecauthorThijs, Steven
dc.contributor.imecauthorVandersteen, Gerd
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecLinten, Dimitri::0000-0001-8434-1838
dc.contributor.orcidimecThijs, Steven::0000-0003-2889-8345
dc.source.peerreviewno
dc.source.conferenceRCJ ESD Symposium
dc.source.conferencedate20/10/2009
dc.source.conferencelocationTokyo Japan
imec.availabilityPublished - imec


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