Authors

Simoen, Eddy; Akheyar, Amal; Rohr, Erika; Mercha, Abdelkarim; Claeys, Cor

Conference

216th ECS Meeting

Title

Low-frequency noise analysis of the impact of an LaO cap layer in HfSiON/Ta2C gate stack nMOSFETs

Publication type

Meeting abstract

Embargo date

9999-12-31