Test data volume comparison of monolithic testing vs. modular SOC testing

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Authors
Sinanoglu, Ozgur; Marinissen, Erik Jan; Sehgal, Anuja; Fitzgerald, Jeff; Rearick, Jeff
ISSN
0740-7475
Issue
3
Journal
IEEE Design & Test of Computers
Volume
26
Title
Test data volume comparison of monolithic testing vs. modular SOC testing
Publication type
Journal article
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