dc.contributor.author | Stoffels, Steve | |
dc.contributor.author | Boedecker, Sebastian | |
dc.contributor.author | Puers, Bob | |
dc.contributor.author | De Wolf, Ingrid | |
dc.contributor.author | Tilmans, Harrie | |
dc.contributor.author | Rembe, Christian | |
dc.date.accessioned | 2021-10-18T03:23:44Z | |
dc.date.available | 2021-10-18T03:23:44Z | |
dc.date.issued | 2009-06 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/16273 | |
dc.source | IIOimport | |
dc.title | Measuring the mechanical resonance frequency and quality factor of MEM resonators with well-defined uncertainties using optical interferometric techniques | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Stoffels, Steve | |
dc.contributor.imecauthor | Puers, Bob | |
dc.contributor.imecauthor | De Wolf, Ingrid | |
dc.contributor.imecauthor | Tilmans, Harrie | |
dc.contributor.orcidimec | De Wolf, Ingrid::0000-0003-3822-5953 | |
dc.contributor.orcidimec | Tilmans, Harrie::0000-0003-4240-4962 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | no | |
dc.source.beginpage | 549 | |
dc.source.endpage | 552 | |
dc.source.conference | Transducers. 15th International Conference on Solid-State Sensors, Actuators and Microsystems | |
dc.source.conferencedate | 21/06/2009 | |
dc.source.conferencelocation | Denver, CO USA | |
imec.availability | Published - open access | |