Authors

Suhane, Amit; Arreghini, Antonio; Van den Bosch, Geert; Breuil, Laurent; Cacciato, Antonio; Rothschild, Aude; Jurczak, Gosia; Van Houdt, Jan; De Meyer, Kristin

Conference

39th European Solid-State Device Research Conference - ESSDERC

Title

Experimental evaluation of trapping efficiency in silicon nitride based charge trapping memories

Publication type

Proceedings paper