Electrical and thermal scaling trends for SOI FinFET ESD design

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Authors
Thijs, Steven; Tremouilles, David; Griffoni, Alessio; Russ, Christian; Linten, Dimitri; Scholz, Mirko; Collaert, Nadine; Rooyackers, Rita; Duvvury, Charvaka; Groeseneken, Guido
Conference
31st Annual EOS/ESD Symposium
Title
Electrical and thermal scaling trends for SOI FinFET ESD design
Publication type
Proceedings paper
Embargo date
9999-12-31
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