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Electrical and thermal scaling trends for SOI FinFET ESD design

dc.contributor.authorThijs, Steven
dc.contributor.authorTremouilles, David
dc.contributor.authorGriffoni, Alessio
dc.contributor.authorRuss, Christian
dc.contributor.authorLinten, Dimitri
dc.contributor.authorScholz, Mirko
dc.contributor.authorCollaert, Nadine
dc.contributor.authorRooyackers, Rita
dc.contributor.authorDuvvury, Charvaka
dc.contributor.authorGroeseneken, Guido
dc.date.accessioned2021-10-18T03:35:48Z
dc.date.available2021-10-18T03:35:48Z
dc.date.issued2009
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/16304
dc.sourceIIOimport
dc.titleElectrical and thermal scaling trends for SOI FinFET ESD design
dc.typeProceedings paper
dc.contributor.imecauthorThijs, Steven
dc.contributor.imecauthorLinten, Dimitri
dc.contributor.imecauthorCollaert, Nadine
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecThijs, Steven::0000-0003-2889-8345
dc.contributor.orcidimecLinten, Dimitri::0000-0001-8434-1838
dc.contributor.orcidimecCollaert, Nadine::0000-0002-8062-3165
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage2A.3
dc.source.conference31st Annual EOS/ESD Symposium
dc.source.conferencedate30/08/2009
dc.source.conferencelocationAnaheim, CA USA
imec.availabilityPublished - open access


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