Authors

Toledano Luque, Maria; Degraeve, Robin; Zahid, Mohammed; Kaczer, Ben; Kittl, Jorge; Jurczak, Gosia; Groeseneken, Guido; Van Houdt, Jan

Conference

IEEE International Electron Devices Meeting - IEDM

Title

Resolving fast VtH transients after program/erase of flash memory stacks and their relation to electron and hole defects

Publication type

Proceedings paper

Embargo date

9999-12-31