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Characteristics and integration challenges of FinFET-based devices for (Sub-)22nm technology nodes circuit applications
Publication:
Characteristics and integration challenges of FinFET-based devices for (Sub-)22nm technology nodes circuit applications
Date
2009-10
Proceedings Paper
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19246.pdf
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Veloso, Anabela
;
Van Dal, Mark
;
Collaert, Nadine
;
De Keersgieter, An
;
Witters, Liesbeth
;
Rooyackers, Rita
;
Redolfi, Augusto
;
Brus, Stephan
;
Duffy, Ray
;
Pawlak, Bartek
;
Vellianitis, Georgios
;
Duriez, Blandine
;
Merelle, Thomas
;
Absil, Philippe
;
Biesemans, Serge
;
Jurczak, Gosia
;
Hoffmann, Thomas Y.
;
Lander, Rob
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Abstract
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Views
1965
since deposited on 2021-10-18
Acq. date: 2025-10-23
Citations
Metrics
Views
1965
since deposited on 2021-10-18
Acq. date: 2025-10-23
Citations