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Application of a nano-mechanical sensor to monitor stress in copper damascene interconnects
Publication:
Application of a nano-mechanical sensor to monitor stress in copper damascene interconnects
Date
2009
Journal article
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Wilson, Chris
;
Croes, Kristof
;
Tokei, Zsolt
;
Vereecke, Bart
;
Beyer, Gerald
;
O'Neill, A.G.
;
Horsfall, A.B.
Journal
Applied Physics Express
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1915
since deposited on 2021-10-18
Acq. date: 2025-10-26
Citations
Metrics
Views
1915
since deposited on 2021-10-18
Acq. date: 2025-10-26
Citations