Physical modeling of strain-dependent hole mobility in Ge p-channel inversion layers

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Authors

Zhang, Yan; Fischetti, Massimo; Soree, Bart; Magnus, Wim; Heyns, Marc; Meuris, Marc

ISSN

0021-8979

Issue

8

Journal

Journal of Applied Physics

Volume

106

Title

Physical modeling of strain-dependent hole mobility in Ge p-channel inversion layers

Publication type

Journal article

Embargo date

9999-12-31

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