Publication:
Channel hot-carrier degradation on strained MOSFETs with embedded SiGe or SiC source/drain
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1917 since deposited on 2021-10-18
1last month
Acq. date: 2026-08-16
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Statistics
Views
1917 since deposited on 2021-10-18
1last month
Acq. date: 2026-08-16
Citations