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Reliability and retention of 1T-RAM cell capacitor less on UTBOX SOI substrates

dc.contributor.authorAoulaiche, Marc
dc.contributor.authorCollaert, Nadine
dc.contributor.authorSimoen, Eddy
dc.contributor.authorMercha, Abdelkarim
dc.contributor.authorDe Wachter, Bart
dc.contributor.authorBourdelle, K.K.
dc.contributor.authorNguyen, B.-Y.
dc.contributor.authorBoedt, F.
dc.contributor.authorDelprat, D.
dc.contributor.authorJurczak, Gosia
dc.contributor.authorAltimime, Laith
dc.date.accessioned2021-10-18T15:15:49Z
dc.date.available2021-10-18T15:15:49Z
dc.date.issued2010
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/16657
dc.sourceIIOimport
dc.titleReliability and retention of 1T-RAM cell capacitor less on UTBOX SOI substrates
dc.typeProceedings paper
dc.contributor.imecauthorCollaert, Nadine
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.imecauthorMercha, Abdelkarim
dc.contributor.imecauthorDe Wachter, Bart
dc.contributor.imecauthorJurczak, Gosia
dc.contributor.orcidimecCollaert, Nadine::0000-0002-8062-3165
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.contributor.orcidimecMercha, Abdelkarim::0000-0002-2174-6958
dc.source.peerreviewno
dc.source.beginpage129
dc.source.endpage130
dc.source.conferenceInternational SOI Conference
dc.source.conferencedate11/10/2010
dc.source.conferencelocationSan Diego, CA USA
imec.availabilityPublished - imec


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