dc.contributor.author | Armini, Silvia | |
dc.contributor.author | Wilson, Chris | |
dc.contributor.author | Moussa, Alain | |
dc.contributor.author | Franquet, Alexis | |
dc.contributor.author | Vanstreels, Kris | |
dc.contributor.author | Atanasova, Tanya | |
dc.contributor.author | Radisic, Alex | |
dc.contributor.author | Civale, Yann | |
dc.contributor.author | Redolfi, Augusto | |
dc.contributor.author | Van Ammel, Annemie | |
dc.contributor.author | El-Mekki, Zaid | |
dc.contributor.author | Bryce, George | |
dc.contributor.author | Ruythooren, Wouter | |
dc.date.accessioned | 2021-10-18T15:16:13Z | |
dc.date.available | 2021-10-18T15:16:13Z | |
dc.date.issued | 2010 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/16668 | |
dc.source | IIOimport | |
dc.title | Seed-less copper electrochemical deposition on PVD resistive substrates as a replacement/enhancement for PVD Cu seed layers in HAR TSVs | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Armini, Silvia | |
dc.contributor.imecauthor | Wilson, Chris | |
dc.contributor.imecauthor | Moussa, Alain | |
dc.contributor.imecauthor | Franquet, Alexis | |
dc.contributor.imecauthor | Vanstreels, Kris | |
dc.contributor.imecauthor | Radisic, Alex | |
dc.contributor.imecauthor | Redolfi, Augusto | |
dc.contributor.imecauthor | Van Ammel, Annemie | |
dc.contributor.imecauthor | El-Mekki, Zaid | |
dc.contributor.imecauthor | Bryce, George | |
dc.contributor.imecauthor | Ruythooren, Wouter | |
dc.contributor.orcidimec | Armini, Silvia::0000-0003-0578-3422 | |
dc.contributor.orcidimec | Franquet, Alexis::0000-0002-7371-8852 | |
dc.contributor.orcidimec | Vanstreels, Kris::0000-0002-4420-0966 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 77 | |
dc.source.endpage | 87 | |
dc.source.conference | Electrochemical Engineering for the 21st Century (dedicated to Richard C. Alkire) | |
dc.source.conferencedate | 24/04/2010 | |
dc.source.conferencelocation | Vancouver Canada | |
imec.availability | Published - open access | |
imec.internalnotes | ECS Transactions; Vol. 28, Iss. 29 | |