Skip to content
Institutional repository
Communities & Collections
Browse all items
Scientific publications
Open knowledge
Log In
imec Publications
Presentations
Non-destructive characterization of activated ion-implanted doping profiles based on photomodulated optical reflectance
Publication:
Non-destructive characterization of activated ion-implanted doping profiles based on photomodulated optical reflectance
Copy permalink
Date
2010
Presentation
Simple item page
Full metadata
Statistics
Loading...
Loading...
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Bogdanowicz, Janusz
;
Clarysse, Trudo
;
Moussa, Alain
;
Mody, Jay
;
Eyben, Pierre
;
Vandervorst, Wilfried
;
Rosseel, Erik
Journal
Abstract
Description
Metrics
Views
1889
since deposited on 2021-10-18
1
last month
1
last week
Acq. date: 2025-12-16
Citations
Metrics
Views
1889
since deposited on 2021-10-18
1
last month
1
last week
Acq. date: 2025-12-16
Citations