dc.contributor.author | Bradon, Neil | |
dc.contributor.author | Nafus, Kathleen | |
dc.contributor.author | Shite, Hideo | |
dc.contributor.author | Kitano, J. | |
dc.contributor.author | Kosugi, H. | |
dc.contributor.author | Goethals, Mieke | |
dc.contributor.author | Cheng, Shaunee | |
dc.contributor.author | Hermans, Jan | |
dc.contributor.author | Hendrickx, Eric | |
dc.contributor.author | Baudemprez, Bart | |
dc.contributor.author | Van Den Heuvel, Dieter | |
dc.date.accessioned | 2021-10-18T15:25:03Z | |
dc.date.available | 2021-10-18T15:25:03Z | |
dc.date.issued | 2010 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/16788 | |
dc.source | IIOimport | |
dc.title | Further investigation of EUV process sensitivities for wafer track processing | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Nafus, Kathleen | |
dc.contributor.imecauthor | Hermans, Jan | |
dc.contributor.imecauthor | Hendrickx, Eric | |
dc.contributor.imecauthor | Baudemprez, Bart | |
dc.contributor.imecauthor | Van Den Heuvel, Dieter | |
dc.contributor.orcidimec | Hermans, Jan::0000-0003-1249-8902 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | no | |
dc.source.beginpage | 763630 | |
dc.source.conference | Extreme Ultraviolet (EUV) Lithography | |
dc.source.conferencedate | 21/02/2010 | |
dc.source.conferencelocation | San Jose, CA USA | |
imec.availability | Published - open access | |
imec.internalnotes | Proceedings SPIE, vol. 7636 | |