Publication:
Electrical properties of InGaAs/high-k oxide interfaces: measurement and simulation
Date
Loading...
Journal
Abstract
Description
Metrics
Views
1900 since deposited on 2021-10-18
Acq. date: 2025-12-09
Citations
Metrics
Views
1900 since deposited on 2021-10-18
Acq. date: 2025-12-09
Citations