Publication:

Electrical properties of InGaAs/high-k oxide interfaces: measurement and simulation

Date

2010
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Author(s)

Brammertz, Guy  
;
Lin, Dennis  
;
Alian, AliReza  
;
Merckling, Clement  
;
Chang, Mark
;
Wang, Wei-E
;
Passlack, Matthias  
;
Caymax, Matty  
;
Meuris, Marc  
;
Heyns, Marc  

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