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Conference contributions
Voltage- and temperature-dependent reliability of the set/reset switching in TiN/HfO2/Pt resistive RAM
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Voltage- and temperature-dependent reliability of the set/reset switching in TiN/HfO2/Pt resistive RAM
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Date
2010
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Chen, Yangyin
;
Goux, Ludovic
;
Pantisano, Luigi
;
Wang, XinPeng
;
Degraeve, Robin
;
Govoreanu, Bogdan
;
Jurczak, Gosia
;
Wouters, Dirk
;
Altimime, Laith
;
Groeseneken, Guido
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1895
since deposited on 2021-10-18
Acq. date: 2026-07-18
Citations
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Views
1895
since deposited on 2021-10-18
Acq. date: 2026-07-18
Citations