Strain measurements in thin film structures by convergent beam electron diffraction

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Authors

Armigliato, A.; Balboni, R.; Benedetti, A.; Frabboni, S.; Tixier, A.; Vanhellemont, Jan

Issue

12

Journal

Journal de Physique III

Volume

7

Title

Strain measurements in thin film structures by convergent beam electron diffraction

Publication type

Journal article

Embargo date

9999-12-31

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