dc.contributor.author | Ercken, Monique | |
dc.contributor.author | Vandeweyer, Tom | |
dc.contributor.author | Versluijs, Janko | |
dc.contributor.author | Truffert, Vincent | |
dc.contributor.author | De Backer, Johan | |
dc.contributor.author | Delvaux, Christie | |
dc.contributor.author | Baerts, Christina | |
dc.date.accessioned | 2021-10-18T16:15:36Z | |
dc.date.available | 2021-10-18T16:15:36Z | |
dc.date.issued | 2010 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/17079 | |
dc.source | IIOimport | |
dc.title | Challenges in setting up the patterning processes for a 16nm node SRAM cell | |
dc.type | Oral presentation | |
dc.contributor.imecauthor | Ercken, Monique | |
dc.contributor.imecauthor | Vandeweyer, Tom | |
dc.contributor.imecauthor | Versluijs, Janko | |
dc.contributor.imecauthor | Truffert, Vincent | |
dc.contributor.imecauthor | De Backer, Johan | |
dc.contributor.imecauthor | Delvaux, Christie | |
dc.contributor.imecauthor | Baerts, Christina | |
dc.contributor.orcidimec | Truffert, Vincent::0000-0001-7851-830X | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | no | |
dc.source.conference | Fujifilm Advanced Lithography Workshop | |
dc.source.conferencedate | 16/09/2010 | |
dc.source.conferencelocation | Dresden Germany | |
imec.availability | Published - open access | |